The Lead-Lag Relationship between the S&P 500 Spot and Futures Markets: An Intraday-Data Analysis Using Threshold Regression Model
Publication Type
Journal Article
Publication Date
3-2010
Abstract
In this paper we examine the lead-lag interaction between the futures and spot markets of the S&P500 using the threshold regression model on intraday data. The use of threshold variables to model the changes in the regression structure with respect to different market conditions enables us to investigate the lead-lag interaction in a data-based approach and avoid stratifying the data arbitrarily. Using the basis as the threshold variable, we find that the short-selling restrictions in the spot market reduce the effect of the spot index as the leading variable. To study the effect of market-wide information on the interaction between the spot and futures markets, we use the coefficient of determination in the regression of the S&P500 on the Morgan-Stanley Composite Index-US and the Major Market Index as the threshold variable. We find that the lead effect of the futures market over the spot market is stronger when there is more market-wide information. On the other hand, the lead effect of the cash market over the futures market is weaker when there is more market-wide information. In addition, we also use the lagged 45-min return of the spot market as the threshold variable. We find that the lead effect of the spot market is stronger in periods of directionless trading than in periods of good or bad markets.
Discipline
Econometrics
Research Areas
Econometrics
Publication
Japanese Economic Review
Volume
61
Issue
1
First Page
133
Last Page
144
ISSN
1352-4739
Identifier
10.1111/j.1468-5876.2009.00481.x
Publisher
Wiley
Citation
TSE, Yiu Kuen and Chan, Wai-Sum.
The Lead-Lag Relationship between the S&P 500 Spot and Futures Markets: An Intraday-Data Analysis Using Threshold Regression Model. (2010). Japanese Economic Review. 61, (1), 133-144.
Available at: https://ink.library.smu.edu.sg/soe_research/492
Additional URL
https://doi.org/10.1111/j.1468-5876.2009.00481.x