Publication Type
Journal Article
Version
acceptedVersion
Publication Date
6-2024
Abstract
Deep Neural Networks (DNNs) have been widely deployed in software to address various tasks (e.g., autonomous driving, medical diagnosis). However, they can also produce incorrect behaviors that result in financial losses and even threaten human safety. To reveal and repair incorrect behaviors in DNNs, developers often collect rich, unlabeled datasets from the natural world and label them to test DNN models. However, properly labeling a large number of datasets is a highly expensive and time-consuming task. To address the above-mentioned problem, we propose NSS, Neuron Sensitivity Guided Test Case Selection, which can reduce the labeling time by selecting valuable test cases from unlabeled datasets. NSS leverages the information of the internal neuron induced by the test cases to select valuable test cases, which have high confidence in causing the model to behave incorrectly. We evaluated NSS with four widely used datasets and four well-designed DNN models compared to the state-of-the-art (SOTA) baseline methods. The results show that NSS performs well in assessing the probability of failure triggering in test cases and in the improvement capabilities of the model. Specifically, compared to the baseline approaches, NSS achieves a higher fault detection rate (e.g., when selecting 5% of the test cases from the unlabeled dataset in the MNIST&LeNet1 experiment, NSS can obtain an 81.8% fault detection rate, which is a 20% increase compared with SOTA baseline strategies).
Keywords
Deep learning testing, neuron sensitivity, model interpretation
Discipline
OS and Networks | Software Engineering
Research Areas
Information Systems and Management
Areas of Excellence
Digital transformation
Publication
ACM Transactions on Software Engineering and Methodology
First Page
1
Last Page
32
ISSN
1049-331X
Identifier
10.1145/3672454
Publisher
Association for Computing Machinery (ACM)
Citation
HUANG, Dong; BU, Qingwen; FU, Yichao; QING, Yuhao; XIE, Xiaofei; CHEN, Junjie; and CUI, Heming.
Neuron sensitivity guided test case selection. (2024). ACM Transactions on Software Engineering and Methodology. 1-32.
Available at: https://ink.library.smu.edu.sg/sis_research/9091
Copyright Owner and License
Authors
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Additional URL
https://doi.org/10.1145/3672454