Publication Type
Conference Proceeding Article
Version
publishedVersion
Publication Date
7-2015
Abstract
Software that support various groups of customers usually require complicated configurations to attain different functionalities. To model the configuration options, feature model is proposed to capture the commonalities and competing variabilities of the product variants in software family or Software Product Line (SPL). A key challenge for deriving a new product is to find a set of features that do not have inconsistencies or conflicts, yet optimize multiple objectives (e.g., minimizing cost and maximizing number of features), which are often competing with each other. Existing works have attempted to make use of evolutionary algorithms (EAs) to address this problem. In this work, we incorporated a novel feedback-directed mechanism into existing EAs. Our empirical results have shown that our method has improved noticeably over all unguided version of EAs on the optimal feature selection. In particular, for case studies in SPLOT and LVAT repositories, the feedback-directed Indicator-Based EA (IBEA) has increased the number of correct solutions found by 72.33% and 75%, compared to unguided IBEA. In addition, by leveraging a pre-computed solution, we have found 34 sound solutions for Linux X86, which contains 6888 features, in less than 40 seconds.
Keywords
Software product line, evolutionary algorithms, SAT solvers
Discipline
Software Engineering | Theory and Algorithms
Research Areas
Software and Cyber-Physical Systems
Publication
Proceedings of the 2015 International Symposium on Software Testing and Analysis, Baltimore, USA, July 13-17
First Page
246
Last Page
256
ISBN
9781450336208
Identifier
10.1145/2771783.2771808
Publisher
ACM
City or Country
Baltimore, USA
Citation
TAN, Tian Huat; XUE, Yinxing; CHEN, Manman; SUN, Jun; LIU, Yang; and DONG, Jin Song Dong.
Optimizing selection of competing features via feedback-directed evolutionary algorithms. (2015). Proceedings of the 2015 International Symposium on Software Testing and Analysis, Baltimore, USA, July 13-17. 246-256.
Available at: https://ink.library.smu.edu.sg/sis_research/4954
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Additional URL
https://doi.org/10.1145/2771783.2771808