Publication Type
Conference Proceeding Article
Version
publishedVersion
Publication Date
11-2017
Abstract
Measuring quality of test suites is one of the major challenges of software testing. Code coverage identifies tested and untested parts of code and is frequently used to approximate test suite quality. Multiple previous studies have investigated the relationship between coverage ratio and test suite quality, without a clear consent in the results. In this work we study whether covered code contains a smaller number of future bugs than uncovered code (assuming appropriate scaling). If this correlation holds and bug density is lower in covered code, coverage can be regarded as a meaningful metric to estimate the adequacy of testing. To this end we analyse 16000 internal bug reports and bug-fixes of SAP HANA, a large industrial software project. We found that the above-mentioned relationship indeed holds, and is statistically significant. Contrary to most previous works our study uses real bugs and real bug-fixes. Furthermore, our data is derived from a complex and large industrial project.
Keywords
software quality, coverage, bug density, large real world project, industry project, empirical research
Discipline
Programming Languages and Compilers | Software Engineering
Research Areas
Data Science and Engineering
Publication
ESEM 2017: Proceedings of 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: Toronto, Canada, November 9-10
First Page
307
Last Page
313
ISBN
9781509040391
Identifier
10.1109/ESEM.2017.44
Publisher
IEEE
City or Country
Piscataway, NJ
Citation
BACH, Thomas; ANDRZEJAK, Artur; PANNEMANS, Ralf; and LO, David.
The impact of coverage on bug density in a large industrial software project. (2017). ESEM 2017: Proceedings of 11th ACM/IEEE International Symposium on Empirical Software Engineering and Measurement: Toronto, Canada, November 9-10. 307-313.
Available at: https://ink.library.smu.edu.sg/sis_research/3913
Copyright Owner and License
Authors
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Additional URL
https://doi.org/10.1109/ESEM.2017.44