Publication Type
Conference Proceeding Article
Version
publishedVersion
Publication Date
8-2014
Abstract
We examine the learning curves of individual software developers in Open-Source Software (OSS) Development. We collected the dataset of multi-year code change histories from the repositories for five open source software projects involving more than 100 developers. We build and estimate regression models to assess individual developers' learning progress (in reducing the likelihood they may make a bug). Our estimation results show that developer's coding experience does not decrease bug ratios while cumulative bug-fixing experience leads to learning progress. The results may have implications and provoke future research on project management about allocating resources on tasks that add new code versus tasks that debug and fix existing code. We also find that different developers indeed make different kinds of bug patterns, supporting personalized bug prediction in OSS network. We found the moderating effects of bug types on learning progress. Developers exhibit learning effects for some simple bug types (e.g., wrong literals) or bug types with many instances (e.g., wrong if conditionals).
Discipline
Computer Sciences | E-Commerce | Software Engineering
Research Areas
Information Systems and Management
Publication
ICEC '14: Proceedings of the Sixteenth International Conference on Electronic Commerce: Philadelphia, August 5-6, 2014
First Page
41
Last Page
48
ISBN
9781450326186
Identifier
10.1145/2617848.2617857
Publisher
ACM
City or Country
New York
Citation
KIM, Youngsoo and JIANG, Lingxiao.
The Learning Curves in Open-Source Software (OSS) Development Network. (2014). ICEC '14: Proceedings of the Sixteenth International Conference on Electronic Commerce: Philadelphia, August 5-6, 2014. 41-48.
Available at: https://ink.library.smu.edu.sg/sis_research/2644
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International License.
Additional URL
http://dx.doi.org/10.1145/2617848.2617857