VDGPG: A virtual data-guided prompt generation framework for incremental learning with application to wafer defect detection
Publication Type
Conference Proceeding Article
Publication Date
10-2025
Abstract
Although convolutional neural networks have been widely used for wafer defect detection in semiconductor manufacturing, they typically rely on static offline datasets to train models. These models show strong reliability when detecting known defect types, but struggle with unknown ones, posing challenges in model adaptation and leading to high maintenance costs. Incremental Learning (IL) offers a solution that allows models to continuously adapt to new types of defects without accessing full historical data. This paper introduces a Virtual Data-Guided Prompt Generation (VDGPG) framework, a novel IL approach for wafer defect detection that integrates prompt-guided learning and dual-branch virtual data generation. Specifically, VDGPG assigns task-specific prompt vectors to individual attention heads, using a channel attention gating mechanism and similarity computation to select prompt vectors from a prompt pool. This enables the model to focus more effectively on the relevant features for each category of defects. The dual-branch virtual data generation module generates diverse virtual samples, with a special emphasis on contour edge generation, which guides the model to learn features of potential new categories proactively. Experiments using the public WM-811K dataset demonstrate that VDGPG achieves significant performance improvements in wafer defect detection over existing IL methods.
Discipline
Artificial Intelligence and Robotics
Research Areas
Intelligent Systems and Optimization
Publication
Proceedings of the 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC), Vienna, Austria, October 5-8
First Page
7074
Last Page
7079
Identifier
10.1109/SMC58881.2025.11343177
Publisher
IEEE
City or Country
Piscataway, NJ
Citation
LIU, Bingwen; TIAN, Yibin; CHAI, Shanglei; ZHANG, Zhiyuan; and ZENG, Zhi.
VDGPG: A virtual data-guided prompt generation framework for incremental learning with application to wafer defect detection. (2025). Proceedings of the 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC), Vienna, Austria, October 5-8. 7074-7079.
Available at: https://ink.library.smu.edu.sg/sis_research/11241
Additional URL
https://doi.org/10.1109/SMC58881.2025.11343177