Publication Type
Conference Proceeding Article
Version
publishedVersion
Publication Date
10-2025
Abstract
Current zero-shot anomaly detection (ZSAD) methods show remarkable success in prompting large pre-trained visionlanguage models to detect anomalies in a target dataset without using any dataset-specific training or demonstration. However, these methods often focus on crafting/learning prompts that capture only coarse-grained semantics of abnormality, e.g., high-level semantics like ‘damaged’, ‘imperfect’, or ‘defective’ objects. They therefore have limited capability in recognizing diverse abnormality details that deviate from these general abnormal patterns in various ways. To address this limitation, we propose FAPrompt, a novel framework designed to learn Fine-grained Abnormality Prompts for accurate ZSAD. To this end, a novel Compound Abnormality Prompt learning (CAP) module is introduced in FAPrompt to learn a set of complementary, decomposed abnormality prompts, where abnormality prompts are enforced to model diverse abnormal patterns derived from the same normality semantic. On the other hand, the fine-grained abnormality patterns can be different from one dataset to another. To enhance the cross-dataset generalization, another novel module, namely Data-dependent Abnormality Prior learning (DAP), is introduced in FAPrompt to learn a samplewise abnormality prior from abnormal features of each test image to dynamically adapt the abnormality prompts to individual test images. Comprehensive experiments on 19 real-world datasets, covering both industrial defects and medical anomalies, demonstrate that FAPrompt substantially outperforms state-of-the-art methods in both imageand pixel-level ZSAD tasks. Code is available at https: //github.com/mala-lab/FAPrompt.
Discipline
Artificial Intelligence and Robotics
Research Areas
Intelligent Systems and Optimization
Areas of Excellence
Digital transformation
Publication
Proceedings of the 2025 IEEE/CVF International Conference on Computer Vision (ICCV), Honolulu, Hawaii, October 19-23
First Page
22241
Last Page
22251
City or Country
Honolulu, Hawai'i
Citation
ZHU, Jiawen; ONG, Yew‑Soon; SHEN, Chunhua; and PANG, Guansong.
Fine-grained abnormality prompt learning for zero-shot anomaly detection. (2025). Proceedings of the 2025 IEEE/CVF International Conference on Computer Vision (ICCV), Honolulu, Hawaii, October 19-23. 22241-22251.
Available at: https://ink.library.smu.edu.sg/sis_research/10841
Creative Commons License

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Additional URL
https://openreview.net/forum?id=kS27PPs3yR