Publication Type

Conference Proceeding Article

Version

publishedVersion

Publication Date

2-2007

Abstract

In this paper, we propose a novel hardware approach to image segmentation, specifically in the case of overlapping particles. Our research is based on multi-flash imaging (MFI), originally developed to detect depth discontinuities. Multiple images captured with different illumination conditions provide additional information about a scene compared to conventional segmentation techniques. Shadows are used to identify true object edges and underlying particles. We applied the new approach in automated particle size analysis and evaluated it against the watershed and canny edge detection techniques. Evaluation results confirm that MFI can be applied in image segmentation and reveals the superiority of the approach against conventional techniques in the case of overlapping particles.

Keywords

Image segmentation, Image analysis, Computer vision, Application software, Layout, Image edge detection, Mining industry, Chemical analysis, Lighting, Image processing

Discipline

Computer Engineering

Research Areas

Data Science and Engineering

Publication

Proceedings of the 2007 IEEE Workshop on Applications of Computer Vision, Austin, Texas, United States, February 21 - 22

First Page

47

ISBN

1550-5790

Identifier

10.1109/WACV.2007.37

Publisher

IEEE

City or Country

Austin, TX, USA

Additional URL

https://doi.org/10.1109/WACV.2007.37

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