Publication Type

Conference Proceeding Article

Version

acceptedVersion

Publication Date

11-2018

Abstract

The interpretation of defect models heavily relies on software metrics that are used to construct them. However, such software metrics are often correlated in defect models. Prior work often uses feature selection techniques to remove correlated metrics in order to improve the performance of defect models. Yet, the interpretation of defect models may be misleading if feature selection techniques produce subsets of inconsistent and correlated metrics. In this paper, we investigate the consistency and correlation of the subsets of metrics that are produced by nine commonly-used feature selection techniques. Through a case study of 13 publicly-available defect datasets, we find that feature selection techniques produce inconsistent subsets of metrics and do not mitigate correlated metrics, suggesting that feature selection techniques should not be used and correlation analyses must be applied when the goal is model interpretation. Since correlation analyses often involve manual selection of metrics by a domain expert, we introduce AutoSpearman, an automated metric selection approach based on correlation analyses. Our evaluation indicates that AutoSpearman yields the highest consistency of subsets of metrics among training samples and mitigates correlated metrics, while impacting model performance by 1-2%pts. Thus, to automatically mitigate correlated metrics when interpreting defect models, we recommend future studies use AutoSpearman in lieu of commonly-used feature selection techniques.

Keywords

Correlated Metrics, Defect Prediction, Feature Selection, Model Interpretation, Software Analytics

Discipline

Software Engineering

Research Areas

Software and Cyber-Physical Systems

Publication

Proceedings of the 34th International Conference on Software Maintenance and Evolution, Madrid, Spain, 2018 September 23-29

First Page

92

Last Page

103

ISBN

9781538678701

Identifier

10.1109/ICSME.2018.00018

Publisher

Institute of Electrical and Electronics Engineers Inc.

City or Country

Madrid, Spain

Additional URL

https://doi.org/10.1109/ICSME.2018.00018

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